From 43ad3eeb659a18c15c7169e7c4d49513e25d745d Mon Sep 17 00:00:00 2001 From: Shaun Ruffell Date: Mon, 23 Sep 2013 13:36:29 -0500 Subject: [PATCH] wct4xxp: Fix bipolar error insertion test mode. This change wouldn't affect most people since it's only used by the error injection code. Signed-off-by: Shaun Ruffell --- drivers/dahdi/wct4xxp/base.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/drivers/dahdi/wct4xxp/base.c b/drivers/dahdi/wct4xxp/base.c index 7b531cc..a4c62dc 100644 --- a/drivers/dahdi/wct4xxp/base.c +++ b/drivers/dahdi/wct4xxp/base.c @@ -505,7 +505,7 @@ static void t4_check_sigbits(struct t4 *wc, int span); #define FMR5_EIBR (1 << 6) /* Internal Bit Robbing Access */ #define DEC_T 0x60 /* Diable Error Counter */ #define IERR_T 0x1B /* Single Bit Defect Insertion Register */ -#define IBV 0 /* Bipolar violation */ +#define IBV (1 << 0) /* Bipolar violation */ #define IPE (1 << 1) /* PRBS defect */ #define ICASE (1 << 2) /* CAS defect */ #define ICRCE (1 << 3) /* CRC defect */