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wct4xxp: Fix bipolar error insertion test mode.

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This change wouldn't affect most people since it's only used by the error
injection code.

Signed-off-by: Shaun Ruffell <sruffell@digium.com>
This commit is contained in:
Shaun Ruffell 2013-09-23 13:36:29 -05:00
parent 706dc43483
commit 43ad3eeb65
1 changed files with 1 additions and 1 deletions
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drivers/dahdi/wct4xxp/base.c
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@ -505,7 +505,7 @@ static void t4_check_sigbits(struct t4 *wc, int span);
#define FMR5_EIBR (1 << 6) /* Internal Bit Robbing Access */
#define DEC_T 0x60 /* Diable Error Counter */
#define IERR_T 0x1B /* Single Bit Defect Insertion Register */
#define IBV 0 /* Bipolar violation */
#define IBV (1 << 0) /* Bipolar violation */
#define IPE (1 << 1) /* PRBS defect */
#define ICASE (1 << 2) /* CAS defect */
#define ICRCE (1 << 3) /* CRC defect */